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Some stochastic properties of upper one-sided X-bar and EWMA charts for mu in the presence of shifts in sigma

Morais, M. C. ; Pacheco, António

Sequential Analysis-Design Methods and Applications, 20 (2001), 1-12

In this paper we shall discuss certain stochastic properties of the run length of upper one-sided andEWMA control charts for the process mean when the quality characteristic is normally distributed. We look at the performance of these two charts in the presence of shifts in the process mean and the standard deviation, and at their ability to detect these latter shifts and to give misleading signals.